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- In Stock: 10
- Manufacturer: IBM
- Model or Part: 39Y7125
- Condition: Refurbished
- Weight: 1.00lb
- Dimensions: 6.10in x 5.70in x 2.00in
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Item Condition
New - Sealed or Open Box ConditionExcellent - Almost-New, Missing Original Packaging
Refurbished - Seller Refurbished, Good Condition, Previously Used Item
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Overview
The IBM Light Path Diagnostic Panel, model 39Y7125 (X3500 series), is a high-precision visual inspection tool designed for rapid fault isolation in complex optical and electronic assemblies. Engineered with rugged industrial-grade components, this panel delivers clear, real-time illumination of light paths, enabling technicians to pinpoint misalignments, connector issues, and component failures without dismantling the system.
Key Features
- Compact rack-mountable design fits standard 19 inch enclosures
- Adjustable LED illumination with selectable intensity levels for optimal contrast
- Integrated high-resolution camera module with live video output to external monitors
- Plug-and-play connectivity via standard USB 2.0 and VGA interfaces
- Self-diagnostic firmware that alerts users to panel health and calibration status
- Modular front panel that can be swapped for different wavelength filters
Technical Specifications
- Model number: 39Y7125
- Operating voltage: 100-240 V AC, 50/60 Hz
- Power consumption: max 45 W
- LED wavelength range: 400-700 nm (visible spectrum)
- Camera resolution: 1280 x 720 pixels (HD)
- Display output: VGA 640 x 480 up to 1920 x 1080
- Environmental rating: operating temperature 0 to 50 degrees C, storage temperature -20 to 70 degrees C
- Dimensions (H x W x D): 1.75 in x 17.5 in x 8.5 in
- Weight: 5.2 lbs
Applications
The Light Path Diagnostic Panel is ideal for use in data center maintenance, telecommunications equipment testing, fiber optic network troubleshooting, and high-performance computing environments. It is also valuable for OEM service labs, research laboratories, and field service engineers who require a portable yet powerful solution for verifying optical signal integrity and diagnosing component failures quickly and accurately.